Senior OCT Photo Metrology Engineer – Yield & Innovation

Micron Technology, Inc. in Singapore seeks an OCT CPEE Photo Metrology Principal/Senior Engineer to lead HVM photo/overlay metrology yield, quality, productivity, and cost improvements. You’ll collaborate with global teams and suppliers, define BKM, and drive cross-fab alignment. The role requires senior expertise in semiconductor photolithography, data-driven problem solving, and strong communication skills, with flexibility for travel and overseas assignments. J-18808-Ljbffr