Principal Engineer, Photo Metrology & Overlay (HVM/NPI)

Micron Technology, Inc. in Singapore seeks an OCT CPEE Photo Metrology Principal/Senior Engineer to lead HVM photo/overlay metrology yield, quality, productivity, and cost improvement initiatives. You will act as the technical authority for resolving complex metrology issues across fabs and drive supplier roadmaps. You will deploy Best Known Methods for HVM and NPI, contribute to cross‑fab and cross‑node alignment, and serve as a key escalation point, collaborating with internal teams and J-188…